Publication:

A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

Date

2023
Proceedings Paper
https://doi.org/10.1109/JCS57290.2023.10102937
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Author(s)

Grill, Alexander  
;
Michl, J.
;
Diaz Fortuny, Javier  
;
Beckers, Arnout  
;
Bury, Erik  
;
Vaisman Chasin, Adrian  
;
Grasser, T.
;
Waltl, M.
;
Kaczer, Ben  
;
De Greve, Kristiaan  

Journal

na

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1021 since deposited on 2023-09-03
Acq. date: 2026-01-25

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1021 since deposited on 2023-09-03
Acq. date: 2026-01-25

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