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A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Publication:
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Date
2023
Proceedings Paper
https://doi.org/10.1109/JCS57290.2023.10102937
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grill, Alexander
;
Michl, J.
;
Diaz Fortuny, Javier
;
Beckers, Arnout
;
Bury, Erik
;
Vaisman Chasin, Adrian
;
Grasser, T.
;
Waltl, M.
;
Kaczer, Ben
;
De Greve, Kristiaan
Journal
na
Abstract
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1017
since deposited on 2023-09-03
Acq. date: 2025-10-23
Citations
Metrics
Views
1017
since deposited on 2023-09-03
Acq. date: 2025-10-23
Citations