Browsing by author "Knuts, Bruno"
Now showing items 1-2 of 2
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Evaluation of TSV and micro-bump probing for wide I/O testing
Smith, Ken; Hanaway, Peter; Jolley, Mike; Gleason, Reed; Strid, Eric; Daenen, Tom; Dupas, Luc; Knuts, Bruno; Marinissen, Erik Jan; Van Dievel, Marc (2011-09) -
On the basic correlation between polysilicon resistor linearity, matching and 1/f noise
Da Rold, Martina; Van Huylenbroeck, Stefaan; Knuts, Bruno; Simoen, Eddy; Decoutere, Stefaan (1999)