Browsing by author "Diouf, C."
Now showing items 1-3 of 3
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A new method for quickly evaluating reversible and permanent components of the BTI degradation
Garros, X.; Subirats, Alexandre; Reimbold, G.; Gaillard, F.; Diouf, C.; Federspiel, X.; Huard, V.; Rafik, M. (2018) -
An extended "Y function" method for saturation regime characterization: application to bulk Si and Ge technologies
Diouf, C.; Cros, A.; Monfray, S.; Mitard, Jerome; Rosa, J.; Gloria, D.; Ghibaudo, G. (2012) -
Y function method applied to saturation regime: apaprent saturation mobility and saturation velocity extraction
Diouf, C.; Cros, A.; Monfray, S.; Mitard, Jerome; Rosa, S.; Gloria, D.; Ghibaudo, G. (2013)