Browsing by author "van Dael, M."
Now showing items 1-3 of 3
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Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
van Dael, M.; Verboven, P.; Zanella, A.; Sijbers, Jan; Nicolai, B. (2019) -
Comparison of methods for online inspection of apple internal quality
van Dael, M.; Verboven, P.; Van Hoorebeke, L.; Sijbers, Jan; Nicolai, B. (2017) -
Multisensor X-ray inspection of internal defects in horticultural products
van Dael, M.; Verboven, P.; Dhaene, J.; Van Hoorebeke, L.; Sijbers, Jan; Nicolai, B. (2017-06)