Browsing by author "El-Sayed, E.-M."

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Modeling the effect of random dopants on hot-carrier degradation in FinFETs

Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, A.; Vandemaele, Michiel; Hellings, Geert; El-Sayed, E.-M.; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019)