Browsing by author "Luo, Weichun"
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Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs
Yang, Hong; Luo, Weichun; Zhou, Longda; Xu, Hao; Tang, Bo; Simoen, Eddy; Yin, Huaxiang; Zhu, Huilong; Zhao, Chao; Wang, Wenwu; Ye, Tianchun (2018)