Browsing by author "Snauwaert, J.J."
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Electrical characterization of submicrometer silicon devices by cross-sectional contact-mode AFM
De Wolf, Peter; Trenkler, Thomas; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaert, J.J.; Hellemans, L. (1996)