Browsing by author "Bayliss, S. C."
Now showing items 1-4 of 4
-
Confocal microscopy and spectroscopy of InGaN epilayers on sapphire
O'Donnell, K. P.; Tobin, M. J.; Bayliss, S. C.; Van der Stricht, Wim (1999) -
Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire
O'Donnell, K. P.; Middleton, P. G.; Trager-Cowan, C.; Young, C.; Bayliss, S. C.; Fletcher, I.; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet (1998) -
Spectroscopy and microscopy of localised and delocalised excitons in InGaN-based light emitting diodes and epilayers
O'Donnell, K. P.; Martin, R. W.; Middleton, P. G.; Bayliss, S. C.; Fletcher, I.; Van der Stricht, Wim; Demeester, Piet; Moerman, Ingrid (1999) -
The optical and structural properties of InGaN epilayers with very high indium content
Bayliss, S. C.; Demeester, Piet; Fletcher, I.; Martin, R. W.; Middleton, P. G.; Moerman, Ingrid; O'Donnell, K. P.; Sapelkin, A.; Trager-Cowan, C.; Van der Stricht, Wim; Young, C. (1999)