Now showing items 1-2 of 2

    • ESD characterization of germanium ESD devices 

      Boschke, Roman; Linten, Dimitri; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Mitard, Jerome; Mertens, Hans; Witters, Liesbeth; Van Campenhout, Joris; Verheyen, Peter; Pogany, Dionyz; Groeseneken, Guido (2014-09)
    • HBM ESD robustness of GaN-on-Si Schottky diodes 

      Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vashchenko, Vlad; Hopper, Peter; Bychikhin, Sergei; Pogany, Dionyz; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2011)