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    • Origins and implications of increased channel hot carrier variability in nFinFETs 

      Kaczer, Ben; Franco, Jacopo; Cho, Moon Ju; Grasser, Tibor; Roussel, Philippe; Tyaginov, Stanislav; Bina, Markus; Wimmer, Y.; Procel, L. M.; Trojman, Lionel; Crupi, Felice; Pitner, Gregory; Putcha, Vamsi; Weckx, Pieter; Bury, Erik; Ji, Z.; De Keersgieter, An; Chiarella, Thomas; Horiguchi, Naoto; Groeseneken, Guido; Thean, Aaron (2015)