Browsing by author "Kraak, Daniel"
Now showing items 1-15 of 15
-
Degradation analysis of high performance 14nm FinFET SRAM
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2018) -
Device aging: A reliability and security concern
Kraak, Daniel; Mottaqiallah, Taouil; Hamdioui, Said; Weckx, Pieter; Catthoor, Francky; Chatterjee, Abhijit; Singh, Adit; Wunderlich, Joachim; Karimi, Naghmeh (2018) -
eSRAM Reliability: Why is it still not optimally solved?
Kraak, Daniel; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2020) -
Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Hardware-based aging mitigation scheme for memory address decoder
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Impact and mitigation of sense amplifier aging degradation using realistic workloads
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2017) -
Impact and mitigation of SRAM read path aging
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2018) -
Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Memory Reliability Analysis Framework: Modeling and Mitigation
Kraak, Daniel (2020) -
Methodology for application-dependent degradation analysis of memory timing
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Mitigation of sense amplifier degradation using input switching
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017) -
Mitigation of Sense Amplifier Degradation Using Skewed Design
Kraak, Daniel; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2020) -
Parametric and functional degradation analysis of complete 14-nm FinFET SRAM
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019) -
Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2019) -
Sense amplifier offset voltage mitigation under presence of BTI
Kraak, Daniel; Agbo, Innocent; Taouil, Motta; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017)