Browsing by author "Hussin, R."
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On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects
Kaczer, Ben; Amoroso, S. M.; Hussin, R.; Asenov, A.; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Grasser, T.; Rzepa, G.; Horiguchi, Naoto (2016)