Authors

Kaczer, Ben; Amoroso, S. M.; Hussin, R.; Asenov, A.; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Grasser, T.; Rzepa, G.; Horiguchi, Naoto

Conference

International Integrated Reliability Workshop - IIRW

Title

On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects

Publication type

Proceedings paper