Browsing by author "Gleason, Reed"
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Evaluation of TSV and micro-bump probing for wide I/O testing
Smith, Ken; Hanaway, Peter; Jolley, Mike; Gleason, Reed; Strid, Eric; Daenen, Tom; Dupas, Luc; Knuts, Bruno; Marinissen, Erik Jan; Van Dievel, Marc (2011-09)