Browsing by author "Hartmann, J.P."
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Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Hue, Florent; Houdellier, F.; Snoeck, E.; Hartmann, J.P.; Destefanis, V.; Bender, Hugo; Claverie, Alain; Hytch, Martin (2008-09)