Browsing by author "Zhang, Yang"
Now showing items 1-2 of 2
-
Interfacial Properties of nMOSFETs With Different Al2O3 Capping Layer Thickness and TiN Gate Stacks
Wang, Danghui; Xu, Tianhan; Simoen, Eddy; Govoreanu, Bogdan; Claeys, Cor; Zhang, Yang (2021) -
Temperature-Dependent Electrical Properties of nMOSFETs With Different Thickness Al2O3 Capping Layer and TiN Gate
Wang, Danghui; Zheng, Junna; Zhang, Yang; Xu, Tianhan; Simoen, Eddy; Govoreanu, Bogdan; Claeys, Cor (2021)