Browsing by author "Herzog, H. J."
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Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, C.; Herzog, H. J.; Blondeel, A.; Clauws, P. (2000) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, Cor; Herzog, H. J.; Blondeel, A.; Clauws, P. (2001)