Browsing by author "Mogilnikov, K.P."
Now showing items 1-3 of 3
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A discussion of the practical importance of positron annihilation lifetime spectroscopy percolation threshold in evaluation of porous low-k dielectrics
Mogilnikov, K.P.; Baklanov, Mikhaïl; Shamiryan, Denis; Petkov, M.P. (2004-01) -
Ellipsometric porosimetry of porous low-k films with quazi-closed cavities
Baklanov, Mikhaïl; Mogilnikov, K.P.; Yim, J-H. (2004) -
Internal matrix structure of low-k nanoporous silica and its relation to mechanical properties
Saxena, R.; Rodriguez, O.; Cho, W.; Gills, W.N.; Plawsky, J.L.; Baklanov, Mikhaïl; Mogilnikov, K.P. (2004-12)