Browsing by author "Moors, Kristof"
Now showing items 1-19 of 19
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Ab initio screening of metallic MAX ceramics for advanced interconnect applications
Sankaran, Kiroubanand; Moors, Kristof; Tokei, Zsolt; Adelmann, Christoph; Pourtois, Geoffrey (2021) -
Alternative metals: from ab initio screening to calibrated narrow line models
Adelmann, Christoph; Sankaran, Kiroubanand; Dutta, Shibesh; Gupta, Anshul; Kundu, Shreya; Jamieson, Geraldine; Moors, Kristof; Pinna, Nicolo; Ciofi, Ivan; Van Elshocht, Sven; Boemmels, Juergen; Boccardi, Guillaume; Wilson, Chris; Pourtois, Geoffrey; Tokei, Zsolt (2018) -
Analytic solution of Ando's surface roughness model with finite domain distribution functions
Moors, Kristof; Soree, Bart; Magnus, Wim (2015) -
Electron relaxation times and resistivity in metallic nanowires due to tilted grain boundary planes
Moors, Kristof; Soree, Bart; Tokei, Zsolt; Magnus, Wim (2015) -
Electron transport and resistivity scaling in nanostructures
Moors, Kristof (2017-01) -
Fabry-Perot interferometry with gate-tunable 3D topological insulator nanowires
Osca, Javier; Moors, Kristof; Soree, Bart; Serra, Llorenc (2021) -
Finite size effects in highly scaled ruthenium interconnects
Dutta, Shibesh; Moors, Kristof; Vandemaele, Michiel; Adelmann, Christoph (2018) -
First-principles-based screening method for resistivity scaling of anisotropic metals
Moors, Kristof; Sankaran, Kiroubanand; Pourtois, Geoffrey; Adelmann, Christoph (2022-12-23) -
Modeling and tackling resistivity scaling in metal nanowires
Moors, Kristof; Soree, Bart; Magnus, Wim (2015) -
Modeling surface roughness scattering in metallic nanowires
Moors, Kristof; Soree, Bart; Magnus, Wim (2015) -
On-chip interconnect trends, challenges and solutions: how to keep RC and reliability under control
Tokei, Zsolt; Ciofi, Ivan; Roussel, Philippe; Debacker, Peter; Raghavan, Praveen; van der Veen, Marleen; Jourdan, Nicolas; Wilson, Chris; Vega Gonzalez, Victor; Adelmann, Christoph; Wen, Liang Gong; Croes, Kristof; Varela Pedreira, Olalla; Moors, Kristof; Krishtab, Mikhail; Armini, Silvia; Boemmels, Juergen (2016) -
Resistivity scaling and electron relaxation times in metallic nanowires
Moors, Kristof; Soree, Bart; Tokei, Zsolt; Magnus, Wim (2014) -
Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering
Moors, Kristof; Soree, Bart; Magnus, Wim (2017) -
Resistivity scaling model for metals with conduction band anisotropy
De Clercq, Miguel; Moors, Kristof; Sankaran, Kiroubanand; Pourtois, Geoffrey; Dutta, Shibesh; Adelmann, Christoph; Magnus, Wim; Soree, Bart (2018) -
Temperature-dependent resistivity of alternative metal thin films
Siniscalchi, Marco; Tierno, Davide; Moors, Kristof; Tokei, Zsolt; Adelmann, Christoph (2020) -
Thickness dependence of the resistivity of platinum-group metal thin films
Dutta, Shibesh; Sankaran, Kiroubanand; Moors, Kristof; Pourtois, Geoffrey; Van Elshocht, Sven; Boemmels, Juergen; Vandervorst, Wilfried; Tokei, Zsolt; Adelmann, Christoph (2017-07) -
Thin film resistivity scaling of metals with conduction band anisotropy
De Clercq, Miguel; Moors, Kristof; Magnus, Wim; Soree, Bart (2018) -
Validity criteria for Fermi's golden rule scattering rates applied to metallic nanowires
Moors, Kristof; Soree, Bart; Magnus, Wim (2016) -
Validity criteria for scattering rates obtained with Fermi's golden rule in semi-classical transport
Moors, Kristof; Soree, Bart; Magnus, Wim (2016)