Browsing by author "Wirth, Gilson"
Now showing items 1-4 of 4
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Atomistic approach to variability of bias-temperature instability in circuit simulations
Kaczer, Ben; Mahato, Swaraj; Valduga de Almeida Camargo, Vinicius; Toledano Luque, Maria; Roussel, Philippe; Grasser, Tibor; Catthoor, Francky; Dobrovolny, Petr; Zuber, Paul; Wirth, Gilson; Groeseneken, Guido (2011-04) -
Fast and accurate statistical characterization of standard cell libraries
Brusamarello, Lucas; Wirth, Gilson; Roussel, Philippe; Miranda Corbalan, Miguel (2011) -
Statistical characterization of standard cells using design of experiments and response surface modelling
Miranda Corbalan, Miguel; Roussel, Philippe; Brusamarello, Lucas; Wirth, Gilson (2011) -
Statistical model for MOSFET bias temperature instability component due to charge trapping
Wirth, Gilson; da Silva, Roberto; Kaczer, Ben (2011)