Browsing by author "den Dekker, A. J."

Now showing items 1-2 of 2

Atom column detection from simultaneously acquired ABF and ADF STEM images

Fatermans, J.; den Dekker, A. J.; Mueller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. (2020)
Recurrent inference machines as inverse problem solvers for MR relaxometry

Sabidussi, E. R.; Klein, S.; Caan, M. W. A.; Bazrafkan, S.; den Dekker, A. J.; Sijbers, Jan; Niessen, W. J.; Poot, D. H. J. (2021)