Browsing by author "Woerlee, P. H."

Now showing items 1-2 of 2

Current-voltage characteristics of gate oxides after hard breakdown

Bearda, Twan; Woerlee, P. H.; Wallinga, H.; Mertens, Paul (2001)
Modelling of crystal originated particles and their impact on gate oxide integrity

Bearda, Twan; Mertens, Paul; Woerlee, P. H.; Wallinga, H.; Schmolke, R.; Heyns, Marc (2002)