Browsing by author "Thayne, I."
Now showing items 1-2 of 2
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Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures
Benbakhti, Brahim; Ayubi-Moak, J.S.; Kalna, Karol; Lin, Dennis; Hellings, Geert; Brammertz, Guy; De Meyer, Kristin; Thayne, I.; Asenov, Asen (2010) -
Strained silicon SiGe HFETs for microwave applications
König, U.; Herzog, H.-J.; Aniel, F.; Kasper, E.; De Meyer, Kristin; Rabe, W.J.; Schumacher, H.; Thayne, I.; Parker, E.H.C. (2003)