Authors

Benbakhti, Brahim; Ayubi-Moak, J.S.; Kalna, Karol; Lin, Dennis; Hellings, Geert; Brammertz, Guy; De Meyer, Kristin; Thayne, I.; Asenov, Asen

ISSN

0026-2714

Issue

3

Journal

Microelectronics Reliability

Volume

50

Title

Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures

Publication type

Journal article