Browsing by author "Dos Santos Filho, Sebastio G."
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Physical characterization of hafnium aluminates dielectrics deposited by atomic layer deposition
Huanca, Danilo R.; Christiano, V.; Adelmann, Christoph; Verdonck, Patrick; Dos Santos Filho, Sebastio G. (2015-09) -
Physical characterization of high-k HfxAl1-xOy gate dielectrics prepared by ALD
Christiano, Verônica; Adelmann, Christoph; Kellermann, Guinther; Verdonck, Patrick; Dos Santos Filho, Sebastio G. (2011)