Browsing by author "Bailleul, A."
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Use of grazing emission XRF for silicon wafer surface contamination measurements
De Gendt, Stefan; Kenis, Karine; Mertens, Paul; Heyns, Marc; Claes, M.; Van Grieken, R. E.; Bailleul, A.; Knotter, Martin; De Bokx, P. K. (1996)