Browsing by author "Royer Del Barrio, Pablo"
Now showing items 1-3 of 3
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Circuit-level modeling of Finfet sub-threshold slope and DIBL mismatch beyond 22nm
Royer Del Barrio, Pablo; Zuber, Paul; Cheng, Binjie; Asenov, Asen; Lopez-Vallejo, M. (2013) -
SRAM scalability assessment in view of variability: a technology perspective
Miranda Corbalan, Miguel; Zuber, Paul; Garcia Bardon, Marie; Royer Del Barrio, Pablo (2012) -
TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
Mallik, Arindam; Zuber, Paul; Liu, Tsung-Te; Chava, Bharani; Ballal, Bhavana; Royer Del Barrio, Pablo; Baert, Rogier; Croes, Kris; Ryckaert, Julien; Badaroglu, Mustafa; Mercha, Abdelkarim; Verkest, Diederik (2013)