Authors

Mallik, Arindam; Zuber, Paul; Liu, Tsung-Te; Chava, Bharani; Ballal, Bhavana; Royer Del Barrio, Pablo; Baert, Rogier; Croes, Kris; Ryckaert, Julien; Badaroglu, Mustafa; Mercha, Abdelkarim; Verkest, Diederik

Conference

50th ACM/EDAC/IEEE Design Automation Conference - DAC

Title

TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes

Publication type

Proceedings paper

Embargo date

9999-12-31