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TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes

Date

2013
Proceedings Paper
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dc.contributor.authorMallik, Arindam
dc.contributor.authorZuber, Paul
dc.contributor.authorLiu, Tsung-Te
dc.contributor.authorChava, Bharani
dc.contributor.authorBallal, Bhavana
dc.contributor.authorRoyer Del Barrio, Pablo
dc.contributor.authorBaert, Rogier
dc.contributor.authorCroes, Kris
dc.contributor.authorRyckaert, Julien
dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.accessioned2021-10-21T09:45:23Z
dc.date.available2021-10-21T09:45:23Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22755
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6560617&punumber%3D6556118%26sortType%3Dasc_p_Sequence%26filter%3DAND
dc.source.conference50th ACM/EDAC/IEEE Design Automation Conference - DAC
dc.source.conferencedate2/06/2013
dc.source.conferencelocationAustin, TX USA
dc.title

TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes

dc.typeProceedings paper
dspace.entity.typePublication
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