Browsing by author "Honicke, P."

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Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence

Honicke, P.; Beckhoff, B.; Kolbe, M.; List, Scott; Conard, Thierry; Struyf, Herbert (2008)
Towards passivation of Ge(100) surfaces by sulfur adsorption from (NH4)2S solution: a combined NEXAFS, STM and LEED study

Fleischmann, Claudia; Sioncke, Sonja; Couet, S.; Schouteden, K.; Beckhoff, Burkhard; Muller, Matthias; Honicke, P.; Kolbe, Michael; Van Haesendonck, C.; Meuris, Marc; Temst, Kristiaan; Vantomme, Andre (2011)