Browsing by author "Alawneh, Isam"
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Characteristics of deep submicron n-MOSFETs in the temperature range 4.2 - 300 K
Alawneh, Isam; Simoen, Eddy; Biesemans, Serge; De Meyer, Kristin; Claeys, Cor (1998) -
Comparison of the freeze-out effect in In and B doped n-MOSFETs in the range 4.2 - 300 K
Alawneh, Isam; Simoen, Eddy; Biesemans, Serge; De Meyer, Kristin; Claeys, C. (1998)