Browsing by author "Colinge, Jean-Pierre"

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Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications

Simoen, Eddy; Magnusson, Ulf; Van den Bosch, Geert; Smeys, Peter; Colinge, Jean-Pierre; Claeys, Cor (1994)
The ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's

Verhaege, K.; Groeseneken, Guido; Colinge, Jean-Pierre; Maes, Herman (1994)