Authors

Simoen, Eddy; Magnusson, Ulf; Van den Bosch, Geert; Smeys, Peter; Colinge, Jean-Pierre; Claeys, Cor

Conference

2nd European Conference on Radiation and its Effects on Components and Systems - RADECS

Title

Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications

Publication type

Proceedings paper