Publication:
Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Magnusson, Ulf | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Smeys, Peter | |
| dc.contributor.author | Colinge, Jean-Pierre | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-09-29T12:55:38Z | |
| dc.date.available | 2021-09-29T12:55:38Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/497 | |
| dc.source.beginpage | 368 | |
| dc.source.conference | 2nd European Conference on Radiation and its Effects on Components and Systems - RADECS | |
| dc.source.conferencedate | 13/09/1993 | |
| dc.source.conferencelocation | St. Malo France | |
| dc.source.endpage | 371 | |
| dc.title | Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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