Browsing by author "Nistor, L.C."
Now showing items 1-3 of 3
-
Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Ghica, C.; Nistor, L.C.; Richard, Olivier; Bender, Hugo; Ulyashin, Aliaksandr; Van Tendeloo, G. (2004) -
TEM characterization of extended defects induced in Si wafers by H-plasma treatment
Ghica, C.; Nistor, L.C.; Bender, Hugo; Richard, Olivier; Van Tendeloo, G.; Ulyashin, A. (2007-01) -
The thermal stability of ALD Zr:Al mixed oxide thin films: an in situ TEM study
Nistor, L.C.; Richard, Olivier; Zhao, Chao; Bender, Hugo; Van Tendeloo, G. (2005-07)