Browsing by author "Daenen, T."
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Impact of elevated source drain architecture on ESD protection devices for a 90 nm CMOS technology node
Thijs, Steven; De Heyn, Vincent; Vassilev, Vesselin; Mahadeva Iyer, Natarajan; Linten, Dimitri; Jeamsaksiri, Wutthinan; Daenen, T.; Jurczak, Gosia; Rooyackers, Rita; Groeseneken, Guido (2003-09)