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    • Sheet-resistance measurements in nanometer-wide conductive lines 

      Bogdanowicz, Janusz; Folkersma, Steven; Sergeant, Stefanie; Schulze, Andreas; Paredis, Kristof; Celano, Umberto; Kunert, Bernardette; Guo, Weiming; Mols, Yves; Petersen, Dirch; Witthoft, Maria-Louise; Hansen, Ole; Henrichsen, Henrik; Nielsen, Pieter; Vandervorst, Wilfried (2017)