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Sheet-resistance measurements in nanometer-wide conductive lines
Publication:
Sheet-resistance measurements in nanometer-wide conductive lines
Date
2017
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogdanowicz, Janusz
;
Folkersma, Steven
;
Sergeant, Stefanie
;
Schulze, Andreas
;
Paredis, Kristof
;
Celano, Umberto
;
Kunert, Bernardette
;
Guo, Weiming
;
Mols, Yves
;
Petersen, Dirch
;
Witthoft, Maria-Louise
;
Hansen, Ole
;
Henrichsen, Henrik
;
Nielsen, Pieter
;
Vandervorst, Wilfried
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Abstract
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1884
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1884
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations