Authors

Bogdanowicz, Janusz; Folkersma, Steven; Sergeant, Stefanie; Schulze, Andreas; Paredis, Kristof; Celano, Umberto; Kunert, Bernardette; Guo, Weiming; Mols, Yves; Petersen, Dirch; Witthoft, Maria-Louise; Hansen, Ole; Henrichsen, Henrik; Nielsen, Pieter; Vandervorst, Wilfried

Conference

EMRS Spring Meeting Symposium S: Analytical Techniques for Precise Characterization of Nano Materials - ALTECH

Title

Sheet-resistance measurements in nanometer-wide conductive lines

Publication type

Meeting abstract