Browsing by author "Theuwis, Antoon"

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A Ge matrix removal method for metallic contamination analysis on Ge wafers using TXRF

Hellin, David; Geens, Veerle; Teerlinck, Ivo; Rip, Jens; Theuwis, Antoon; De Gendt, Stefan; Vinckier, Chris (2004)
Grown-in defects in germanium

Vanhellemont, Jan; Simoen, Eddy; Romandic, Igor; Theuwis, Antoon (2007)