Browsing by author "Lo, Ting-Chun"
Now showing items 1-1 of 1
-
Using Gate Leakage Conduction to Understand Positive Gate Bias Induced Threshold Voltage Shift in p-GaN Gate HEMTs
Tang, Shun-Wei; Bakeroot, Benoit; Huang, Zhen-Hong; Chen, Szu-Chia; Lin, Wei-Syuan; Lo, Ting-Chun; Borga, Matteo; Wellekens, Dirk; Posthuma, Niels; Decoutere, Stefaan; Wu, Tian-Li (2023-02)