Browsing by author "Nakaei, T."

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Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

Scholz, Mirko; Thijs, Steven; Linten, Dimitri; Tremouilles, David; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Natarajan, M.I.; Groeseneken, Guido (2007)
On-wafer human metal model measurements for system-level ESD analysis

Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, P.; Groeseneken, Guido (2009-09)