Browsing by author "Geiser, Brian"
Now showing items 1-2 of 2
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Automated calibration of model-driven reconstructions in atom probe tomography
Fletcher, Charles; Moody, Michael P.; Fleischmann, Claudia; Dialameh, Masoud; Porret, Clément; Geiser, Brian; Haley, Daniel (2022) -
Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried; Geiser, Brian; Bunton, Joe; Ulfig, Robert; Larson, Dave (2020)