Browsing by author "Moeller, W."
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Depth profiling of ZrO2/SiO2/Si stacks-TOF-SIMS and computer simulation study
Ignatova, V.A.; Conard, Thierry; Moeller, W.; Vandervorst, Wilfried; Gijbels, R. (2003)
Now showing items 1-1 of 1