Browsing by author "Neumaier, P."
Now showing items 1-4 of 4
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Characterization of ultra thin oxynitrides, a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, I.; Neumaier, P.; Dollinger, G.; Dobeli, M. (1999) -
Characterization of ultra thin oxynitrides: a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bermaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000) -
High resolution depth profiling of future gate dielectric materials
Bergmaier, A.; Dollinger, G.; Görgens, L.; Neumaier, P.; Bender, Hugo; Brijs, Bert; Conard, Thierry; Houssiau, L. (2003) -
High resolution elastic recoil detection
Dollinger, G.; Bergmaier, A.; Goergens, L.; Neumaier, P.; Vandervorst, Wilfried; Jakschik, S. (2004)