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High resolution depth profiling of future gate dielectric materials
Publication:
High resolution depth profiling of future gate dielectric materials
Date
2003
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bergmaier, A.
;
Dollinger, G.
;
Görgens, L.
;
Neumaier, P.
;
Bender, Hugo
;
Brijs, Bert
;
Conard, Thierry
;
Houssiau, L.
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2077
since deposited on 2021-10-15
459
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2077
since deposited on 2021-10-15
459
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations