Browsing by author "Schuessler, M."
Now showing items 1-2 of 2
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Characterisation of reliability of compound semiconductor devices using electrical pulses
Brandt, M.; Krozer, V.; Schuessler, M.; Bock, Karlheinz; Hartnagel, H. L. (1996) -
Pulsed stress reliability investigations of Schottky diodes and HBTs
Schuessler, M.; Krozer, V.; Bock, Karlheinz; Hartnagel, H. L. (1996)