Browsing by author "Wiesler, I"

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An alternative application of ToF-SIMS/in-situ AFM: controlled sample preparation for IC failure analysis

Franquet, Alexis; Spampinato, Valentina; Khaled, Ahmad; Conard, Thierry; Brand, Sebastian; Kogel, M; Wiesler, I; De Wolf, Ingrid (2019)