Browsing by author "Bayer, Armin"

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Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range

Barkusky, Frank; Peth, Christian; Bayer, Armin; Mann, Klaus; John, Joachim; Malinowski, Pawel (2009)
Radiation hardness of Al(x)Ga(1-x)N photodetectors exposed to Extreme UltraViolet (EUV) light beam

Malinowski, Pawel; John, Joachim; Lorenz, Anne; Cheng, Kai; Derluyn, Joff; Germain, Marianne; De Moor, Piet; Minoglou, Kiki; Barkusky, Frank; Bayer, Armin; Mann, Klaus; Duboz, Jean-Yves; Semond, Fabrice; Hochedez, Jean-Francois; Giordanengo, Boris; Borghs, Gustaaf; Mertens, Robert (2009)