Browsing by author "Farris, M."

Now showing items 1-2 of 2

Justifications for reducing HBM and MM ESD qualification test time

Verhaege, Koen; Robinson-Hahn, D.; Russ, Christian; Farris, M.; Scanlon, J.; Lin, D.; Veltri, J.; Groeseneken, Guido (1996)
Recommendations to further improvements of HBM ESD component level test specifications

Verhaege, Koen; Russ, Christian; Robinson-Hahn, D.; Farris, M.; Scanlon, J.; Lin, Don; Veltri, J.; Groeseneken, Guido (1996)