Browsing by author "Fouchier, M."
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Characterization and otimalization of 65nm CMOS technology using scanning spreading resistance microscopy
Eyben, Pierre; De Keersgieter, An; Chramtsov, I.; Fouchier, M.; Janssens, Tom; Vandervorst, Wilfried (2005) -
Probing electrical properties of semiconductor structures on the nm-scale
Vandervorst, Wilfried; Meuris, Marc; De Wolf, P.; Alvarez, D.; Hantschel, Thomas; Trenkler, T.; Fouchier, M.; Duhayon, Natasja; Polspoel, Wouter; Mody, Jay (2008)